Home > Term: ellipsometry
ellipsometry
A technique for determining the properties of a material from the characteristics of light reflected from its surface. The materials studied include thin films, semiconductors, metals, and liquids.
- Μέρος του λόγου: noun
- Κλάδος/Τομέας: Επιστήμη
- Category: Γενική επιστήμη
- Company: McGraw-Hill
0
Δημιουργός
- Francisb
-
(Platinum) 6779 points - 100% positive feedback
